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152A
Winter 2008
Instructor: Ryan
Kastner
Schedule:MW 12:00-2:30
Course Information
This class will
utilize commercially available mixed-signal ICs to elucidate
how to perform bench testing to validate the performance
specifications listed in the datasheet provided by the manufacturer.
In particular, the class will focus on testing several analog-to-digital
and digital-to-analog converters –
ADCs and DACs. If time permits, a fully integrated radio-frequency
phase-locked loop (PLL) IC will also be tested.
To provide the essential background for the testing assignments, the lectures
will cover the following topics in details:
(1) understanding the datasheet of a data converter IC,
(2) fundamental of sampled systems,
(3) data converter specifications,
(4) data converter architectures,
(5) testing techniques for data converters, and
(6) test board design issues and interface circuit requirements.
From this course, the students will acquire in-depth knowledge for data converter
performance specifications, design trade-off of different converter architectures,
and hands-on experience of testing off-the-shelf data converters.
Assignments
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